Lithium and SEI Chemistry in 3D
Visualize lithium distribution, SEI composition, and electrolyte breakdown products with integrated 3D ToF-SIMS, providing critical chemical insight that conventional techniques cannot achieve.
TESCAN AMBER X 2 for Batteries
Advance battery performance and safety with the TESCAN AMBER X 2, a plasma FIB-SEM solution designed for multimodal 3D characterization of electrodes, separators, and interfaces.
This workflow integrates large-area Xe plasma FIB cross-sectioning, artifact-free polishing, and AI-guided TEM lamella preparation with correlative ToF-SIMS, EDS, and EBSD analysis. With AMBER X 2, you gain fast, reliable insight into both the structure and chemistry of energy storage materials.
- Visualize lithium distribution, SEI chemistry, and degradation pathways with integrated 3D ToF-SIMS and multimodal tomography
- Prepare millimeter-scale cross sections free of curtaining artifacts using Rocking Stage and TRUE-X-Sectioning technology
- Protect air- and beam-sensitive electrodes through cryogenic sample preparation and inert gas transfer
- Automate reproducible, Ga-free TEM lamella preparation with TEM AutoPrep Pro, enabling unattended overnight operation
- Interpret structural and chemical datasets with intuitive 3D visualization in the TESCAN 3D Viewer
FOR BATTERY RESEARCH APPLICATIONS
Post-Cycling Battery Failure Analysis
Electrode particle degradation drives capacity fade and internal resistance growth. Tescan AMBER X 2 with ToF-SIMS and Raman spectroscopy enables full structural and chemical analysis of degradation processes.
- Visualize exfoliation and fracturing in anodes and cathodes
- Map lithium trapping and chemical inhomogeneity in 3D
- Correlate microstructural and chemical data for targeted improvements
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Solid Electrolyte and SEI Research
Solid-state batteries promise safety and higher energy density, but interfaces are critical. Tescan AMBER X 2 workflows expose interfacial integrity, adhesion, and lithium distribution.
- Visualize electrolyte adhesion at solid-state interfaces
- Map lithium accumulation and transport with ToF-SIMS
- Identify cracking and degradation pathways in polymer-based solid-state batteries
Quantify Battery Electrode Porosity Across Large Volumes
Understanding electrode porosity is key to predicting electrolyte uptake and cycle stability. Large-volume FIB-SEM tomography with Tescan AMBER X 2 delivers statistically meaningful 3D datasets that go beyond conventional 2D cross sections.
- Analyze void fraction and pore networks in 3D
- Quantify structural variation across large electrode volumes
- Correlate porosity with performance, lifespan, and manufacturing quality
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Improving Battery Formation Protocols with Post-Mortem Characterization
Formation protocols define SEI properties and long-term performance. Tescan’s multimodal workflows reveal how different formation strategies influence stability and capacity.- Characterize SEI morphology and chemistry with SEM, ToF-SIMS, and STEM
- Compare cycling protocols across graphite–LFP cells
- Correlate fluorine infiltration, morphology, and performance retention
AI-GUIDED WORKFLOWS FOR CONSISTENT BATTERY SPECIMEN PREPARATION
TEM AutoPrep™ Pro automates the complete TEM lamella preparation process, delivering clean, Ga-free specimens optimized for nanoscale battery analysis. Integrated into the Essence™ GUI, AutoPrep™ Pro removes operator variability and ensures reproducibility across multiple samples and sites.
AI-guided routines handle trench milling, lift-out, grid placement, and 500 eV final polishing, producing lamellae with the right thickness and orientation for high-resolution STEM, EDS, and ToF-SIMS correlation. Multi-site batch operation enables unattended overnight preparation, saving valuable operator time.
With TEM AutoPrep™ Pro, battery researchers and manufacturers can depend on consistent, high-quality lamellae that reduce preparation time and accelerate the investigation of critical interfaces and degradation mechanisms.
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"Tescan AMBER X 2, our latest innovation in materials analysis technology. The AMBER X 2, with its advanced Plasma FIB-SEM capabilities, offers unmatched speed, precision, and versatility, setting a new standard in the field."
PETR KLIMEK
PRODUCT MARKETING DIRECTOR
MATERIAL & GEO SCIENCE
TESCAN
PRODUCT MARKETING DIRECTOR
MATERIAL & GEO SCIENCE
TESCAN
Unlocked content
Tescan AMBER X with iFIB+™ control and real-time SE signal end pointing delivers precise Sub-20 nm node delayering. Achieve planar surfaces below 5 nm RMS roughness, maintain dielectric compatibility, and prepare contamination-free structures ready for in-situ nanoprobing and electrical failure analysis.
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