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Accelerating the Art
of Discovery

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FemtoChisel for high-precision semiconductor sample prep
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Tescan Solutions

materialscience

Explore Material Science at Micro and Nano Scale with Precision

Analyze structure, defects and interfaces using FIB-SEM, STEM and micro-CT systems built to support every stage from R&D to production. Use these tools to ensure consistency throughout your workflow.

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Advance Semiconductor Failure Analysis with Confidence

Ensure device integrity and consistent results throughout various analysis phases. Our solutions support precise delayering, TEM lamella preparation, non-destructive 3D imaging, and package-level cross-sectioning. They help isolate faults, validate advanced packaging, and identify root causes reliably. Automated workflows and precise endpointing provide clarity and uniformity, helping you make quicker decisions and improve device performance.

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Advance Battery Research and Production with Confidence

Deliver reliable insights throughout the energy storage lifecycle, from raw material optimization to cell design and recycling. Our comprehensive workflows integrate high-resolution imaging, multimodal analysis, and non-destructive 3D visualization to uncover particle morphology, electrode interfaces, and failure mechanisms, all while maintaining sample integrity. Automated workflows deliver reproducible data that improve quality assurance, accelerate innovation, and promote sustainability in advanced battery technologies.

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Explore Life Sciences at Native State with Confidence

Preserve cellular and tissue structures with cryogenic FIB-SEM workflows for precise biological analysis. Covering cryo-ET sample prep, surface morphology, and 3D volume reconstruction, our tools assist multiple phases of life science research. Consistent cryogenic conditions, automated milling, and accurate imaging preserve structural integrity, providing reproducible, high-resolution data for better biological system insights.

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Explore Geoscience Below the Surface with Clarity

Visualize subsurface structures and pore networks to improve understanding of fluid flow, mineral distribution, and reservoir behavior. Our integrated workflows merge high-resolution 3D imaging with quantitative analysis, supporting CO₂ and H₂ storage, mineral processing, and reservoir studies. They maintain sample integrity while generating reproducible data that correlates microstructure with performance, so you can make confident, data-driven decisions for each subsurface challenge.

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materialscience

Explore Material Science at Micro and Nano Scale with Precision

Analyze structure, defects and interfaces using FIB-SEM, STEM and micro-CT systems built to support every stage from R&D to production. Use these tools to ensure consistency throughout your workflow.

Discover more
semiconductors (2)

Advance Semiconductor Failure Analysis with Confidence

Ensure device integrity and consistent results throughout various analysis phases. Our solutions support precise delayering, TEM lamella preparation, non-destructive 3D imaging, and package-level cross-sectioning. They help isolate faults, validate advanced packaging, and identify root causes reliably. Automated workflows and precise endpointing provide clarity and uniformity, helping you make quicker decisions and improve device performance.

Discover more
Frame 722 (1) (1)

Advance Battery Research and Production with Confidence

Deliver reliable insights throughout the energy storage lifecycle, from raw material optimization to cell design and recycling. Our comprehensive workflows integrate high-resolution imaging, multimodal analysis, and non-destructive 3D visualization to uncover particle morphology, electrode interfaces, and failure mechanisms, all while maintaining sample integrity. Automated workflows deliver reproducible data that improve quality assurance, accelerate innovation, and promote sustainability in advanced battery technologies.

Discover more
Frame 722 (3)

Explore Life Sciences at Native State with Confidence

Preserve cellular and tissue structures with cryogenic FIB-SEM workflows for precise biological analysis. Covering cryo-ET sample prep, surface morphology, and 3D volume reconstruction, our tools assist multiple phases of life science research. Consistent cryogenic conditions, automated milling, and accurate imaging preserve structural integrity, providing reproducible, high-resolution data for better biological system insights.

Discover more
Frame 722 (2) (1)

Explore Geoscience Below the Surface with Clarity

Visualize subsurface structures and pore networks to improve understanding of fluid flow, mineral distribution, and reservoir behavior. Our integrated workflows merge high-resolution 3D imaging with quantitative analysis, supporting CO₂ and H₂ storage, mineral processing, and reservoir studies. They maintain sample integrity while generating reproducible data that correlates microstructure with performance, so you can make confident, data-driven decisions for each subsurface challenge.

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Accelerating science

Interview

Interview | How Electron Microscopy Reveals Material History | Tescan MIRA XR

Discover how researchers at the University of Žilina use electron microscopy and Tescan MIRA XR to study metallic materials, fractography, structural changes, and industrial failures

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Blog

How Does a Scanning Electron Microscope Work? | SEM Explained

Learn how a scanning electron microscope (SEM) works using the simple analogy of the Battleship game. Explore SEM signals, raster scanning, and FIB-SEM workflows.

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Blog

Integrated 4D-STEM Detector for SEM & FIB-SEM | Tescan

Discover how Tescan’s integrated retractable 4D-STEM detector enables diffraction-based analysis directly in SEM and FIB-SEM workflows for advanced materials characterization.

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Blog

Micro-CT to FIB-SEM Failure Analysis Workflow | Advanced Packaging

Discover how Micro-CT, ultrafast laser processing, and FIB-SEM create a faster, more reliable failure analysis workflow for advanced semiconductor packaging.

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Discover the power

of Tescan instruments
MIRA XR GM MONO Metal

Scanning Electron Microscopes (SEM)

Tescan’s SEM platforms provide high-resolution imaging and surface analysis with exceptional contrast, detail, and ease of use—ideal for materials research, quality control, and analytical applications.

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AMBER 2

Focused Ion Beam-Scanning Electron Microscopes (FIB-SEM)

Tescan FIB-SEM systems combine fast, precise milling with high-resolution imaging and advanced automation. Choose from Ga or Xe plasma FIB sources to match your needs in sample prep, prototyping, or failure analysis.

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MICRO_UniTOM_HR_1-1

Micro-computed tomography (microCT)

Tescan’s X-ray micro-CT systems deliver fast, high-resolution 3D and 4D imaging for non-destructive internal analysis. Dynamic in-situ capabilities and modular designs make them ideal for advanced research across materials, life sciences, and energy storage.

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TENSOR_1

4D STEM

Tescan's TENSOR is the first 4D-STEM platform built for intuitive multimodal nanocharacterization, combining structural, morphological, and chemical insights in every scan. Real-time data processing, automation, and scripting support make it ideal for both routine and advanced research.

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Laser solutions

FemtoChisel is the next-generation femtosecond laser solution built specifically for semiconductor sample preparation and failure analysis. For too long, the industry has had to compromise between throughput, precision, and Surface Quality. Now all are delivered on one integrated platform.  

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Ex Situ Lift-Out Solutions

Tescan EXLO is designed for laboratories where TEM throughput, reproducibility, and cost efficiency matter. By moving specimen lift-out outside the FIB-SEM, EXLO keeps valuable beam time focused on milling, while parallelizing lamella transfer and grid mounting. The result: higher output, lower cost per specimen, and a more efficient workflow.

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About Tescan

Decades of Progress, Just Getting Started

Since 1991, Tescan systems have been designed to feel seamless, intuitive, and built for real research. Think of us as reducing the coefficient of friction between question and discovery.

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GET IN Touch

Contact us
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Your nearest office is:

Tescan Brno
Libušina tř. 21
623 00 Brno - Kohoutovice

Czech Republic

+420 530 353 411
info@Tescan.com

130405923 us US 37.09024 -95.712891 25.3575 29.349345 20.67957527 42.082797 39.91384763 -33.693421 13.93320106 3.039986586 31.997988 38.050985 47.579533 48.1485965 58.375799 54.663142 19.195447 56.975106 47.916997 50.493053 45.868592 10.79556993 44.35660598 43.2371604 55.536415 14.557577179752773 32.100937 -6.116829 -6.212299277967318 33.600194 -12.08688 23.7104 -33.471062 31.998740087 -23.69149395 43.462349 51.529848 49.1893523 49.197486 25.072375 31.075811 1.299027 40.676979 52.30150662 51.013813 35.684121 37.566531 52.246622 40.581349 39.911632 -26.1811371 41.818215 33.429928

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