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The Combined Automated Petrography and Microanalysis solution for Geoscientists

An intelligent system that automates mineral identification and analysis with precision and clarity. See every detail, uncover every element, and turn complex data into clear geological insight. Because discovery should be as effortless as it is extraordinary.

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Contents

Non-Destructive 3D Mineral Identification Using Spectral Micro-CT

Spectral micro-CT reveals both structure and composition in high-resolution 3D, without destroying the sample. Identify valuable minerals like gold, tungsten, or tantalum—clearly, quickly, and with full spatial context. Turn complex geological data into confident, actionable insight.

  • Non-Destructive 3D Mineral Identification – Go beyond traditional 2D limits with high-resolution spectral micro-CT that visualizes both structure and composition in a single workflow.

  • Advanced Ore Characterization – Differentiate minerals with overlapping densities—such as pyrite and chalcopyrite—using complete X-ray attenuation spectra.

  • Quantitative Elemental Detection – Identify and measure high-Z minerals like gold, tungsten, and tantalum with precision through K-edge imaging and Zeff mapping.

  • Accurate, Bias-Free Analysis – Eliminate sampling errors from resin mounting and reveal true mineral distributions for reliable geological interpretation.

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1_3D scan of grain mount and analysis of dense particles color-coded to size-2
Validate New Mineral Discoveries with Tescan Sample Preparation and EBSD Analysis

Even as new minerals are found, confirming them requires precise crystallographic data. FIB-SEM streamlines the process—preparing, imaging, and analyzing samples in one workflow for fast, reliable mineral identification. This seamless approach helps geoscientists uncover and validate new minerals with confidence and efficiency.

  • Site-Specific Sample Preparation – Precisely polish micron-sized grains under live SEM control to preserve critical structural details.

  • Optimized Imaging Conditions – Apply and selectively remove conductive coatings to enable high-resolution, low-noise imaging for crystallographic analysis.

  • Integrated EBSD Characterization – Perform elemental and crystallographic analysis in the same workflow, delivering recognized data for IMA/CNMNC validation.

  • Complete Discovery-to-Verification Workflow – Move seamlessly from sample preparation to structural confirmation within one instrument — fast, accurate, and non-destructive.

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Site specific, precisely controlled preparation of fine grains

Tescan Solutions

for Mineral Processing

Tescan AMBER X 2 with EBSD Detector

Tescan AMBER X 2 with the Mistral™ Xe plasma FIB column is designed for site-specific preparation and offers  polishing of large areas on heterogeneous samples. The system delivers high beam currents for faster milling rates, ensuring efficient polishing of extensive regions while maintaining uniform, artifact-free surface quality. 

Key Benefits of Tescan FIB-SEMs for EBSD Sample Preparation:

  • Superior EBSD Results – Precise FIB-SEM polishing produces smooth, deformation-free surfaces for high-quality patterns and reliable indexing.

  • Automated Surface Perfection – The Essence™ Low Angle Polishing workflow optimizes positioning, reduces artifacts, and finishes with low ion energies.

  • Confident, Controlled Preparation – Real-time SEM monitoring safeguards delicate features and ensures accurate, repeatable results.

TESCAN UniTOM XL

Large-Volume Dynamic Imaging for Geological and Ore Samples 

TESCAN UniTOM XL enables high-resolution, wide-field scanning of full-size rock cores and grain mounts with optional spectral capability. 

  • Dual-detector system: conventional and spectral CT 

  • Supports both structural and chemical characterization 

  • Ideal for unprocessed drill core and mounted ore samples

Tescan Spectral CT

Energy-Resolved Detector for Elemental Imaging in 3D. Tescan Spectral detector transforms standard micro-CT into a spectral imaging platform able to detect elemental signatures across an entire volume.

  • Photon-counting detection with 140 energy bins 

  • 20–160 keV spectral range 

  • Enables K-edge imaging, density, and Zeff mapping

Explore the system that moves your research forward 

Tescan instruments are designed to help you get answers. Fast and precisely. Talk to our experts and see the solution in action. 

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Where can you find us:

Tescan
Libušina třída 21
623 00 Brno
Czech Republic

info@Tescan.com